Low Power Killer: Extending the battery lifespan by reducing I/O on mobile devices

Se Jun Han, Donghyun Kang, Y. Eom
{"title":"Low Power Killer: Extending the battery lifespan by reducing I/O on mobile devices","authors":"Se Jun Han, Donghyun Kang, Y. Eom","doi":"10.1109/ICCE.2015.7066534","DOIUrl":null,"url":null,"abstract":"The I/O caused by background applications shorten the lifespan of mobile devices because they affect the behavior of power intensive hardware. Our efficient power management scheme addresses this problem by killing unnecessary applications. Our results show LPK extends the lifespan up to 9.4% compared to baseline on a real device.","PeriodicalId":169402,"journal":{"name":"2015 IEEE International Conference on Consumer Electronics (ICCE)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Conference on Consumer Electronics (ICCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCE.2015.7066534","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

The I/O caused by background applications shorten the lifespan of mobile devices because they affect the behavior of power intensive hardware. Our efficient power management scheme addresses this problem by killing unnecessary applications. Our results show LPK extends the lifespan up to 9.4% compared to baseline on a real device.
低功耗杀手:通过减少移动设备上的I/O来延长电池寿命
后台应用程序造成的I/O会缩短移动设备的寿命,因为它们会影响高功耗硬件的行为。我们高效的电源管理方案通过删除不必要的应用程序来解决这个问题。我们的结果显示,与真实设备上的基线相比,LPK延长了9.4%的寿命。
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