Sums of products of polynomials in few variables : lower bounds and polynomial identity testing

Mrinal Kumar, Shubhangi Saraf
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引用次数: 22

Abstract

We study the complexity of representing polynomials as a sum of products of polynomials in few variables. More precisely, we study representations of the form $$P = \sum_{i = 1}^T \prod_{j = 1}^d Q_{ij}$$ such that each $Q_{ij}$ is an arbitrary polynomial that depends on at most $s$ variables. We prove the following results. 1. Over fields of characteristic zero, for every constant $\mu$ such that $0 \leq \mu < 1$, we give an explicit family of polynomials $\{P_{N}\}$, where $P_{N}$ is of degree $n$ in $N = n^{O(1)}$ variables, such that any representation of the above type for $P_{N}$ with $s = N^{\mu}$ requires $Td \geq n^{\Omega(\sqrt{n})}$. This strengthens a recent result of Kayal and Saha [KS14a] which showed similar lower bounds for the model of sums of products of linear forms in few variables. It is known that any asymptotic improvement in the exponent of the lower bounds (even for $s = \sqrt{n}$) would separate VP and VNP[KS14a]. 2. We obtain a deterministic subexponential time blackbox polynomial identity testing (PIT) algorithm for circuits computed by the above model when $T$ and the individual degree of each variable in $P$ are at most $\log^{O(1)} N$ and $s \leq N^{\mu}$ for any constant $\mu < 1/2$. We get quasipolynomial running time when $s < \log^{O(1)} N$. The PIT algorithm is obtained by combining our lower bounds with the hardness-randomness tradeoffs developed in [DSY09, KI04]. To the best of our knowledge, this is the first nontrivial PIT algorithm for this model (even for the case $s=2$), and the first nontrivial PIT algorithm obtained from lower bounds for small depth circuits.
少变量多项式乘积和:下界与多项式恒等检验
我们研究了将多项式表示为多项式在少数变量下的乘积和的复杂性。更准确地说,我们研究了$$P = \sum_{i = 1}^T \prod_{j = 1}^d Q_{ij}$$形式的表示,使得每个$Q_{ij}$是一个任意多项式,它最多依赖于$s$变量。我们证明了以下结果。1. 在特征为零的域上,对于$\mu$这样的每一个常数$0 \leq \mu < 1$,我们给出了一个显式的多项式族$\{P_{N}\}$,其中$P_{N}$在$N = n^{O(1)}$变量中是$n$的度数,这样对于$P_{N}$和$s = N^{\mu}$的上述类型的任何表示都需要$Td \geq n^{\Omega(\sqrt{n})}$。这加强了Kayal和Saha [KS14a]最近的一个结果,该结果显示了在少数变量下线性形式的乘积和模型的类似下界。众所周知,下界指数的任何渐近改进(即使对于$s = \sqrt{n}$)都会将VP和VNP分开[KS14a]。2. 对于上述模型计算的电路,当$T$和$P$中每个变量的个体度对于任意常数$\mu < 1/2$最多等于$\log^{O(1)} N$和$s \leq N^{\mu}$时,我们得到了一种确定性的次指数时间黑盒多项式恒等式检验(PIT)算法。我们得到了近似多项式的运行时间当$s < \log^{O(1)} N$。PIT算法是通过将我们的下界与[DSY09, KI04]中开发的硬度-随机性权衡相结合而获得的。据我们所知,这是该模型的第一个非平凡PIT算法(即使对于$s=2$这种情况),也是第一个从小深度电路的下界获得的非平凡PIT算法。
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