A Study on Shoot-Through Reduction of DC-DC Converter Pre-Driver using Starving Resistor

Sayan Sarkar, W. Ki
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引用次数: 2

Abstract

This research studies the effect of a starving resistor in various pre-driver schemes for shoot-through loss reduction in the buffer of an integrated DC-DC converter and explores how the efficiency is affected. The starving resistor (Bidirectional delay element) reduces the short circuit current of an inverter by developing time skewed gate driving signals for the driven stage NMOS and PMOS inside a buffer. The starving resistor scheme enhances the efficiency if it is inside the buffer of a switch, but is not as efficient if it is inside the buffer of an active diode. The efficiency of the buffer can be further enhanced by adding delay generator schemes within a buffer. Results are validated via extensive SPICE simulations.
利用饥饿电阻降低DC-DC变换器预驱动的通爆率研究
本研究研究了饿阻电阻在各种预驱动方案中对集成DC-DC变换器缓冲器中穿透损耗降低的影响,并探讨了效率是如何受到影响的。饥饿电阻(双向延迟元件)通过在缓冲器内为驱动级NMOS和PMOS产生时间偏斜的门驱动信号来减小逆变器的短路电流。饥饿电阻方案提高效率,如果它是一个开关的缓冲区内,但不是有效的,如果它是在一个有源二极管的缓冲区内。通过在缓冲区中添加延迟发生器方案,可以进一步提高缓冲区的效率。结果通过广泛的SPICE模拟得到验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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