R. Neumayer, A. Stelzer, F. Haslinger, J. Held, F. Schinco, R. Weigel
{"title":"Continuous simulation of system-level automotive EMC problems","authors":"R. Neumayer, A. Stelzer, F. Haslinger, J. Held, F. Schinco, R. Weigel","doi":"10.1109/ISEMC.2003.1236631","DOIUrl":null,"url":null,"abstract":"Electromagnetic compatibility (EMC) issues are increasingly important to the automotive industry. Potential EMC problems arise from the growing use of electronic systems on the one hand and the lack of flexibility in placement or design of electronic modules on the other hand. In this paper we present a continuous EMC simulation process based on the exchange of EMC models between car manufacturer, electronic supplier and IC developer as applied to a general automotive application. The described process fundamentally influences the introduction of new technologies in automobiles by cutting the risk of EMC-failure and avoiding expensive and time-consuming redesigns.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2003.1236631","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
Electromagnetic compatibility (EMC) issues are increasingly important to the automotive industry. Potential EMC problems arise from the growing use of electronic systems on the one hand and the lack of flexibility in placement or design of electronic modules on the other hand. In this paper we present a continuous EMC simulation process based on the exchange of EMC models between car manufacturer, electronic supplier and IC developer as applied to a general automotive application. The described process fundamentally influences the introduction of new technologies in automobiles by cutting the risk of EMC-failure and avoiding expensive and time-consuming redesigns.