Determination of structural changes and temperature distribution within crystals

Abstract

Results of the X-ray method of contactless determination of structural changes within crystals with simultaneous temperature distribution determination have been presented. The method of temperature distribution determination uses X-ray topography based on the use of phenomena of diffraction patterns change with the change of interatomic distance in crystals under the temperature effect. Using the methods of double-crystal spectrometry and the topographic methods of Berch-Barrett and Lang, the structural changes in crystals are determined under cyclic temperature effects. This enables one to consecutively observe aging and degradation processes of materials under the effect of cycling loads. Experimental methods, investigation results and error analysis have been given.