Three approaches to design fault tolerant programmable logic arrays

ACM-SE 28 Pub Date : 1990-04-01 DOI:10.1145/98949.99035
S. Al-Arian, H.P. Kunamneni
{"title":"Three approaches to design fault tolerant programmable logic arrays","authors":"S. Al-Arian, H.P. Kunamneni","doi":"10.1145/98949.99035","DOIUrl":null,"url":null,"abstract":"The objective of this paper is to design Fault Tolerant Program m able Logic Arrays (FTPLA). The task of designing FTPLA's can be divided in two parts: fault detection and fault correction or masking. Three ap p roach es to a ch iev e this objective are presented. The fault detection step is ach ieved through designing a self-checking circuit for each approach. On the other hand, the fault correction capability is achieved through three different and distinct techniques. The first approach im plem ents hardware redundancy, w here m-out-of-n c o d e s are considered with replication. The second approach however, u ses time redundancy, where alternating logic is Implemented and the checker is designed using kout of-2k co d es. In the third technique, another input Is added and the data retry technique is employed. The outputs of the PLA are connected to D-latches and the network outputs are taken from a common bus. All Three techniques are applied and the PLA's are realized. In addition the overhead for each approach is evaluated.","PeriodicalId":409883,"journal":{"name":"ACM-SE 28","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM-SE 28","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/98949.99035","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The objective of this paper is to design Fault Tolerant Program m able Logic Arrays (FTPLA). The task of designing FTPLA's can be divided in two parts: fault detection and fault correction or masking. Three ap p roach es to a ch iev e this objective are presented. The fault detection step is ach ieved through designing a self-checking circuit for each approach. On the other hand, the fault correction capability is achieved through three different and distinct techniques. The first approach im plem ents hardware redundancy, w here m-out-of-n c o d e s are considered with replication. The second approach however, u ses time redundancy, where alternating logic is Implemented and the checker is designed using kout of-2k co d es. In the third technique, another input Is added and the data retry technique is employed. The outputs of the PLA are connected to D-latches and the network outputs are taken from a common bus. All Three techniques are applied and the PLA's are realized. In addition the overhead for each approach is evaluated.
设计容错可编程逻辑阵列的三种方法
本文的目标是设计可容错程序逻辑阵列(FTPLA)。FTPLA的设计任务可分为两部分:故障检测和故障校正或屏蔽。提出了实现这一目标的三种可行方法。通过为每种方法设计一个自检电路来实现故障检测步骤。另一方面,故障纠正能力是通过三种不同的、不同的技术来实现的。第一种方法实现了硬件冗余,其中考虑了复制的m-out- n - c / s。然而,第二种方法使用了时间冗余,其中实现了交替逻辑,并且使用kout -2k编码来设计检查器。在第三种技术中,增加了另一个输入并采用了数据重试技术。PLA的输出连接到d锁存器,网络输出从公共总线获取。这三种技术都得到了应用,实现了解放军的目标。此外,还评估了每种方法的开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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