Stress Analysis and Reliability Calculation of Saturable Reactor of HVDC Converter Valve in HEMP Environment

Zebin Yang, Jiangnan Chen, Cuicui Liu, Yating Gou, Jiachen Tian, F. Zhuo, Feng Wang
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引用次数: 4

Abstract

The threat of HEMP (high-altitude nuclear electromagnetic pulse) in power system deserves in-depth study. Saturable reactor acts as a protection device for the thyristor, and its normal operation determines the normal operation of the whole thyristor converter valve. The failure rate of saturable reactor is a key parameter for the overall reliability evaluation, whose value varies according to the electrical stress and thermal stress conditions. In this paper, a precision wideband model considering the different capacitive parasitic parameters of a saturable reactor is proposed. Then, the electrical stress, heat loss and instantaneous temperature rise of the saturable reactor in a single valve are accurately calculated. Finally, the failure mechanism of saturable reactor in HEMP environment is analyzed, which could be used in the further research on the reliability of thyristor converter valve in HEMP environment.
高压直流换流阀饱和电抗器在HEMP环境下的应力分析及可靠性计算
高空核电磁脉冲对电力系统的威胁值得深入研究。饱和电抗器作为可控硅的保护装置,它的正常工作决定了整个可控硅换流阀的正常工作。饱和电抗器的故障率是整体可靠性评估的关键参数,其数值随电应力和热应力条件的变化而变化。本文提出了考虑不同电容寄生参数的饱和电抗器精确宽带模型。然后,精确计算了单阀饱和反应器的电应力、热损失和瞬时温升。最后,分析了饱和电抗器在HEMP环境下的失效机理,为进一步研究可控硅换流阀在HEMP环境下的可靠性提供了理论依据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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