Neutron sensitivity of high voltage SiC devices for avionics applications

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI:10.1109/RADECS50773.2020.9857698

C. Weulersse, M. Mazurek, S. Morand, C. Binois, O. Crépel

引用次数: 0

Abstract

The SEE radiation tolerance of power SiC devices from several manufacturers has been studied. Safe Operating Areas, as well as failure rates at aircraft altitudes, have been characterized through testing at ChipIr facility, in order to validate the common used derating value of 50%.

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航空电子设备用高压SiC器件的中子灵敏度

本文研究了不同厂家功率SiC器件的SEE辐射容限。通过ChipIr设施的测试，安全操作区域以及飞机高度的故障率已被表征，以验证常用的降额值为50%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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