OLED matrix displays: technology and fundamentals

W. Kowalsky, E. Becker, T. Benstem, T. Dobbertin, D. Heithecker, H. Johannes, D. Metzdorf, H. Neuner
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引用次数: 13

Abstract

For more than a decade, considerable effort has been put into the development of light emitting devices based on evaporated layers of organic semiconductors. To date, the properties of matrix displays consisting of organic light emitting diodes (OLEDs) basically meet automotive and consumer product requirements. OLED matrix displays offer high contrast, wide viewing angle and a broad temperature range at low power consumption. In contrast to polymer devices, OLEDs are processed in ultrahigh vacuum systems. The organic source materials are sublimated from effusion cells. Due to the sensitivity of organic thin films, device structuring by conventional etching techniques is not feasible and alternative structuring techniques were developed. Electrical current in organic devices is limited by the low conductivity of organic semiconductors and by energy barriers at the metal-organic semiconductor interface. Photoelectric measurements facilitate the determination of barrier height differences between various electrode set-ups. Further insights into the energy band alignment at organic heterointerfaces are gained by ultraviolet photoelectron spectroscopy (UPS). In addition to widely employed electrical (I-V, C-V) and optical (PI) measurements, thermally stimulated current (TSC) and luminescence (TSL) allow the characterization and a more detailed understanding of carrier traps and charge transport in organic devices. Energy transfer in a doped OLED emitting layer can be investigated by time-resolved photoluminescence measurements.
OLED矩阵显示器:技术和基础
十多年来,人们为开发基于有机半导体蒸发层的发光器件付出了相当大的努力。迄今为止,由有机发光二极管(oled)组成的矩阵显示器的性能基本满足汽车和消费产品的要求。OLED矩阵显示器在低功耗下提供高对比度,宽视角和宽温度范围。与聚合物器件相比,oled是在超高真空系统中加工的。有机源物质是从渗出细胞中升华出来的。由于有机薄膜的敏感性,传统的蚀刻技术无法实现器件的结构,因此开发了替代的结构技术。有机器件中的电流受到有机半导体的低导电性和金属-有机半导体界面上的能量障碍的限制。光电测量有助于确定各种电极设置之间的势垒高度差。紫外光电子能谱(UPS)进一步深入了解了有机异质界面的能带排列。除了广泛使用的电(I-V, C-V)和光学(PI)测量外,热刺激电流(TSC)和发光(TSL)允许表征和更详细地了解有机器件中的载流子陷阱和电荷输运。可以通过时间分辨光致发光测量来研究掺杂OLED发射层中的能量转移。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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