{"title":"Taking into Account Asynchronous Signals in Functional Test of Complex Circuits","authors":"C. Bellon, R. Velazco","doi":"10.1109/DAC.1984.1585843","DOIUrl":null,"url":null,"abstract":"The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.","PeriodicalId":188431,"journal":{"name":"21st Design Automation Conference Proceedings","volume":"64 8-9","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Design Automation Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1984.1585843","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.