A customer-oriented test-estimation test

Abstract

In this paper, a customer-oriented test, estimation test (COTET), is presented, which is an application of estimation theory into compact testing, to speed up error detection with optimized test quality in VLSI circuits. An algorithm is developed for customers to estimate and generate test parameters efficiently in COTET. Finally, the COTET will be evaluated by simulation to prove its efficiency. The results of the simulation will be given in presentation.<>