W. Eisenstadt, M. Roos, Devin Morris, J. González-Jiménez, Christopery Mounet, M. Barragán, G. Léger, F. Cilici, E. Lauga-Larroze, S. Mir, S. Bourdel, M. Margalef-Rovira, I. Alaji, H. Ghanem, G. Ducournau, C. Gaquière
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Abstract
This paper presents an innovative integrated load-pull bench at 160 GHz. The proposed system, which is designed in a 55-nm BiCMOS technology, is tailored to deal with all of the measurement functions including signal generation, shaping, and magnitude and phase measurement. This system will allow precise characterization of Devices-Under-Test (DUTs) (i.e., circuits and/or devices) when integrated together with the DUT. In addition, the proposed system could also be envisioned as a System-on-Chip (SoC) that, when reported into an RF probe, could serve as a test bench for any integrated circuit.
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