Use of the self-organizing feature map to diagnose abnormal engineering change

Ruei-Shan Lu, Zhi-Ting Wu, K. Peng, Tai-Yi Yu
{"title":"Use of the self-organizing feature map to diagnose abnormal engineering change","authors":"Ruei-Shan Lu, Zhi-Ting Wu, K. Peng, Tai-Yi Yu","doi":"10.1117/12.2197118","DOIUrl":null,"url":null,"abstract":"This study established identification manners with self-organizing feature map (SOM) to achieve the goal of monitoring Engineering Change (EC) based on historical data of a company that specializes in computers and peripherals. The product life cycle of this company is 3–6 months. The historical data were divided into three parts, each covering four months. The first part, comprising 2,343 records from January to April (the training period), comprise the Control Group. The second and third parts comprise Experimental Groups (EG) 1 and 2, respectively. For EG 1 and 2, the successful rate of recognizing information on abnormal ECs was approximately 96% and 95%, respectively. This paper shows the importance and screening procedures of abnormal engineering change for a particular company specializing in computers and peripherals.","PeriodicalId":273984,"journal":{"name":"CiiT international journal of digital image processing","volume":"114 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"CiiT international journal of digital image processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2197118","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This study established identification manners with self-organizing feature map (SOM) to achieve the goal of monitoring Engineering Change (EC) based on historical data of a company that specializes in computers and peripherals. The product life cycle of this company is 3–6 months. The historical data were divided into three parts, each covering four months. The first part, comprising 2,343 records from January to April (the training period), comprise the Control Group. The second and third parts comprise Experimental Groups (EG) 1 and 2, respectively. For EG 1 and 2, the successful rate of recognizing information on abnormal ECs was approximately 96% and 95%, respectively. This paper shows the importance and screening procedures of abnormal engineering change for a particular company specializing in computers and peripherals.
利用自组织特征映射诊断工程异常变化
本研究基于某计算机及外设生产企业的历史数据,建立了基于自组织特征映射(SOM)的识别方法,以实现对工程变更(EC)的监控。本公司的产品生命周期为3-6个月。历史数据分为三部分,每部分覆盖四个月。第一部分包括1月至4月(训练期)的2 343份记录,由控制组组成。第二部分和第三部分分别为实验组(EG) 1和2。对于EG 1和EG 2,异常ECs信息的识别成功率分别约为96%和95%。本文阐述了某计算机及外围设备生产企业异常工程变更的重要性和筛选程序。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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