Enhancing the Efficiency of Thin-Film Heterojunction Solar Cells with CIGS using Alternative Metal Chalcogenide Buffer Layers: SCAPS-1D Simulation software

S. Zyoud, Malek G. Daher, M. Shabat
{"title":"Enhancing the Efficiency of Thin-Film Heterojunction Solar Cells with CIGS using Alternative Metal Chalcogenide Buffer Layers: SCAPS-1D Simulation software","authors":"S. Zyoud, Malek G. Daher, M. Shabat","doi":"10.1109/ieCRES57315.2023.10209492","DOIUrl":null,"url":null,"abstract":"In the majority of cutting-edge Copper Indium Gallium Diselenide (CIGS) photovoltaic cells, Cadmium Sulfide (CdS) is employed as the buffer layer. However, due to the hazardous properties associated with CdS, it is imperative to investigate alternative materials that can offer safety next to both environmental and economic benefits. To facilitate this investigation, the SCAPS-ID computational modeling software has been utilized to analyze pertinent data. A plethora of comprehensive studies have been conducted to ascertain whether other eco-friendly and cost-effective materials, such as Zinc Selenide (ZnSe), Zinc Sulfide (ZnS), Cadmium Selenide (CdSe), and Indium Sulfide (In283), could effectively replace the CdS (buffer) layer in CIGS solar cells. The findings indicate that when CdS and ZnSe are implemented as buffer layers, the photovoltaic cells exhibit superior performance efficiency metrics. The SCAPS-ID simulations demonstrate that optimal p-njunction device efficiency parameters are achieved when the CIGS (absorber) layer thickness spans between 1200 and 1500 nm, the ZnSe (buffer) layer thickness varies from 20 to 60 nm, and the thickness of the Aluminum-doped Zinc Oxide (ZnO:Al) (window) layer measures 25 nm.","PeriodicalId":431920,"journal":{"name":"2023 8th International Engineering Conference on Renewable Energy & Sustainability (ieCRES)","volume":"77 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 8th International Engineering Conference on Renewable Energy & Sustainability (ieCRES)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ieCRES57315.2023.10209492","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In the majority of cutting-edge Copper Indium Gallium Diselenide (CIGS) photovoltaic cells, Cadmium Sulfide (CdS) is employed as the buffer layer. However, due to the hazardous properties associated with CdS, it is imperative to investigate alternative materials that can offer safety next to both environmental and economic benefits. To facilitate this investigation, the SCAPS-ID computational modeling software has been utilized to analyze pertinent data. A plethora of comprehensive studies have been conducted to ascertain whether other eco-friendly and cost-effective materials, such as Zinc Selenide (ZnSe), Zinc Sulfide (ZnS), Cadmium Selenide (CdSe), and Indium Sulfide (In283), could effectively replace the CdS (buffer) layer in CIGS solar cells. The findings indicate that when CdS and ZnSe are implemented as buffer layers, the photovoltaic cells exhibit superior performance efficiency metrics. The SCAPS-ID simulations demonstrate that optimal p-njunction device efficiency parameters are achieved when the CIGS (absorber) layer thickness spans between 1200 and 1500 nm, the ZnSe (buffer) layer thickness varies from 20 to 60 nm, and the thickness of the Aluminum-doped Zinc Oxide (ZnO:Al) (window) layer measures 25 nm.
利用替代金属硫族化物缓冲层提高CIGS薄膜异质结太阳能电池的效率:SCAPS-1D仿真软件
在大多数先进的铜铟镓二硒化(CIGS)光伏电池中,硫化镉(cd)被用作缓冲层。然而,由于与cd相关的危险特性,研究能够同时提供环境和经济效益的安全替代材料势在必行。为了便于调查,利用SCAPS-ID计算建模软件分析相关数据。大量的综合研究已经进行,以确定是否其他环保和具有成本效益的材料,如硒化锌(ZnSe),硫化锌(ZnS),硒化镉(CdSe)和硫化铟(In283),可以有效地取代CIGS太阳能电池中的cd(缓冲)层。研究结果表明,当CdS和ZnSe作为缓冲层时,光伏电池表现出优异的性能效率指标。SCAPS-ID模拟表明,当CIGS(吸收层)厚度在1200 ~ 1500 nm之间,ZnSe(缓冲层)厚度在20 ~ 60 nm之间,掺铝氧化锌(ZnO:Al)(窗口)层厚度为25 nm时,p- n结器件效率参数达到最佳。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信