Nanoelectronic properties of Si and Ge: A semi-empirical approximation

Á. Miranda, F. A. Serrano, R. Vázquez-Medina, M. Cruz‐Irisson
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Abstract

A semi-empirical nearest-neighbor tight-binding approach, that reproduces the indirect band gaps of Si and Ge crystalline, has been applied to study the electronic band dispersion relation of Si and Ge nanowires (NWs). The NWs are modeling by free standing, infinitely long and homogeneous NWs cross sections with the wire axis along the zaxis. The calculations show that Si NWs keeps the indirect bandgap while Ge NWs changes into the direct bandgap when the wire cross-section becomes smaller. Also, the band gap enhancement of Si NWs showing to quantum confinement effects is generally larger than that of similar-sized Ge NWs, confirming the larger quantum confinement effects in Si than in Ge when they are confined in two dimensions.
Si和Ge的纳米电子性质:半经验近似
采用半经验近邻紧密结合的方法,再现了Si和Ge晶体的间接带隙,研究了Si和Ge纳米线的电子能带色散关系。NWs是由独立的,无限长和均匀的NWs横截面,导线轴沿z轴建模的。计算结果表明,当导线截面变小时,Si NWs保持间接带隙,而Ge NWs变为直接带隙。此外,Si NWs受量子约束效应的带隙增强通常大于类似尺寸的Ge NWs,这证实了当Si NWs被限制在二维中时,Si NWs的量子约束效应比Ge NWs更大。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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