High performance photo-sensitive insulating materials for high density multi-layer wiring boards

M. Morishima, H. Akahoshi, M. Kawamoto, T. Suwa, M. Miyazaki, H. Fukai
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引用次数: 1

Abstract

The photo-via build-up process is a most significant candidate for fabrication of high density multi-layer wiring boards for high density packaging using CSP and flip-chip direct attach. We have developed a new type of photo-sensitive dielectric. The dielectric delivers high resolution in fabrication of photoformed microvia holes with an aspect ratio of 1.0. The photo-sensitive dielectric showed excellent electrical and mechanical properties for surface mounted wiring boards. It also shows outstanding mechanical properties, especially in the high temperature region. Excellent insulating properties and adhesion were proven, even after pressure cooker test (PCT) conditions. These features offer a great advantage in achieving higher interconnect reliability in direct-chip attachment on low cost multichip modules using sequential build-up substrates.
用于高密度多层线路板的高性能光敏绝缘材料
光电构筑工艺是利用CSP和倒装芯片直接连接制造高密度多层配线板的最重要的候选工艺。我们研制了一种新型光敏电介质。该电介质在制造宽高比为1.0的光形成微孔时提供了高分辨率。光敏电介质在表面贴装线路板上表现出优异的电性能和机械性能。它还表现出优异的机械性能,特别是在高温区域。优异的绝缘性能和附着力被证明,即使经过压力锅测试(PCT)条件。这些特点为实现更高的互连可靠性提供了巨大的优势,在低成本的多芯片模块上使用顺序构建基板直接芯片连接。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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