Development of the MPD fast forward detector electronics test bench

Abstract

A test bench for the Front-End Electronics (FEE) of the Fast Forward Detector (FFD), which is a part of the Multi-Purpose Detector (MPD) facility, has been developed. The test bench includes a FEE testing card and two types of pulse generators. The FEE testing card and one signal generator are used for the front-end board parameters check. This procedure includes verification of the channel gain, the pulse shape and width, the FEE working conditions, etc. The second one is Low-Voltage Differential Signaling (LVDS) generator intended for Signal Processing Module (SPM) testing with special software. This procedure includes checking the SPM signal processing algorithms.