Planning of truncated sequential binomial tests via the ASN-increase parameter

Abstract

The Sequential Probability Ratio Test (SPRT) is the most common acceptance test in the field of reliability and quality control of electronic systems. Proposed are measures of the test quality. One of them is the increase in the Average Sample Number (ASN) caused by the test truncation. An optimality criterion based on it considerably facilitates solution of the problems in automatic planning of the test. Also given are formulas for determining one of the parameters of the test boundaries — the Truncation Apex (TA), depending on the required test characteristics. A user's algorithm for the planner is also included.