A 7th Order Unit Element Filter in VIS-SC Technique

D. Herbst, A. Fettweis, B. Hoefflinger, U. Kleine, W. Nientiedt, J. Pandel, R. Schweer
{"title":"A 7th Order Unit Element Filter in VIS-SC Technique","authors":"D. Herbst, A. Fettweis, B. Hoefflinger, U. Kleine, W. Nientiedt, J. Pandel, R. Schweer","doi":"10.1109/ESSCIRC.1980.5468805","DOIUrl":null,"url":null,"abstract":"The large parasitic capacitances of MOS capacitors to substrate usually degrades the performance of VIS-SC filters. It will be discussed, how the effect of such parasitics can be reduced by selection of a suitable set of network elements. Experimental results of a fully integrated 7th order low pass with only 4 op amps will be given.","PeriodicalId":168272,"journal":{"name":"ESSCIRC 80: 6th European Solid State Circuits Conference","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC 80: 6th European Solid State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1980.5468805","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

The large parasitic capacitances of MOS capacitors to substrate usually degrades the performance of VIS-SC filters. It will be discussed, how the effect of such parasitics can be reduced by selection of a suitable set of network elements. Experimental results of a fully integrated 7th order low pass with only 4 op amps will be given.
VIS-SC技术中的7阶单元元滤波器
MOS电容对衬底的较大寄生电容通常会降低VIS-SC滤波器的性能。我们将讨论如何通过选择一组合适的网络元素来减少这种寄生的影响。本文给出了仅4个运放的全集成7阶低通的实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信