Fast near-field characterization of integrated circuits electromagnetic interference

Abstract

This paper describes method for speed improvement of electromagnetic near-field scanning. Using the technique described in this paper both high spatial resolution and high speed of measurement can be achieved. Some applications of near-field scanning are presented and discussed. Near-field scan technique is used for measurement of magnetic field distribution above a passive structure and for analysis of electromagnetic emission of integrated circuit operating in different regimes. Results show good reliability of presented method and its effectiveness for investigation of electromagnetic interference in integrated structures.