{"title":"Automatic test system advances transformer protection","authors":"A. Apostolov, B. Vandiver","doi":"10.1109/67.831426","DOIUrl":null,"url":null,"abstract":"In the last 10 years, computers have become part of every aspect of power system protection engineering. Multifunctional microprocessor-based relays with increasing complexity require the development and application of sophisticated computer software for the analysis, setting coordination, data acquisition and testing of such intelligent electronic devices (IEDs). Their functionality is modular and, at the same time, very specialized, as required by the protected substation or power system equipment. Conventional methods and test devices used for the testing of electromechanical protective relays are no longer adequate for the testing of advanced microprocessor relays.","PeriodicalId":435675,"journal":{"name":"IEEE Computer Applications in Power","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Computer Applications in Power","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/67.831426","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
In the last 10 years, computers have become part of every aspect of power system protection engineering. Multifunctional microprocessor-based relays with increasing complexity require the development and application of sophisticated computer software for the analysis, setting coordination, data acquisition and testing of such intelligent electronic devices (IEDs). Their functionality is modular and, at the same time, very specialized, as required by the protected substation or power system equipment. Conventional methods and test devices used for the testing of electromechanical protective relays are no longer adequate for the testing of advanced microprocessor relays.