Laser-welded connections for high-power electronics in mobile systems

M. Weigl, A. Grimm, M. Schmidt
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引用次数: 2

Abstract

Laser welding of direct copper-aluminum connections typically leads to the formation of intermetallic phases and an embrittlement of the metal joints. Considering mobile systems such an embrittlement reduces the durability against temperature cycling as well as against dynamic load significantly and limits the overall long-term stability. By means of adapted filler materials it is possible to reduce the brittle phases and thereby enhance the ductility of these dissimilar connections. As the element silicon features quite a well compatibility with copper and aluminum, filler materials based on Al-Si and Cu-Si alloys are used in the current research studies. In contrast to direct Cu-Al welds, the aluminum filler alloy AlSi12 effectuates a more uniform element mixture and a significantly enhanced ductility.
移动系统中大功率电子器件的激光焊接连接
铜铝直接连接的激光焊接通常会导致金属间相的形成和金属接头的脆化。考虑到移动系统,这种脆化大大降低了温度循环和动态载荷的耐久性,并限制了整体的长期稳定性。通过适当的填充材料,可以减少脆性相,从而提高这些不同连接的延展性。由于硅元素与铜、铝具有良好的相容性,目前的研究主要采用Al-Si和Cu-Si合金作为填充材料。与直接铜铝焊接相比,铝填充合金AlSi12实现了更均匀的元素混合,并显着增强了延展性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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