Microcomputer-based speckle pattern imaging system

Abstract

An automatic speckle pattern imaging system for measuring minute displacement without contact is presented in this paper. The system uses double-exposure method to produce the speckle pattern which is transformed into digital signal by CCD camera and A / D converter and then processed by a microcomputer -based imaging system for noise filtering, feature extraction and result display. The basic relation of the measurements, the system setup, the basic idea of the noise filtering and feature extraction are described, and the experimental results are given.