Formulation of single event burnout failure rate for high voltage devices in satellite electrical power system

Y. Shiba, Erdenebaatar Dashdondog, Masaki Sudo, I. Omura
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引用次数: 6

Abstract

Single-Event Burnout (SEB) is a catastrophic failure in the high voltage devices that is initiated by the passage of particles during turn-off state. Previous papers reported that SEB failure rate increases sharply when applied voltage exceeds a certain threshold voltage. On the other hand, the high voltage devices for the artificial satellite have been increasing. In space, due to increase flux of particle, it is predicted that SEB failure rate will be higher. In this paper, we proposed the failure rate calculation method for high voltage devices based on SEB cross section and flux of particles. This formula can calculate the failure rate at space level and terrestrial level depending on the applied voltage of the high voltage devices.
卫星电力系统高压装置单事件烧毁故障率公式
单事件烧坏(Single-Event Burnout, SEB)是高压器件在关断状态下由粒子通过引起的灾难性故障。以往文献报道了当外加电压超过某一阈值电压时,SEB故障率急剧增加。另一方面,用于人造卫星的高压装置也在不断增加。在空间中,由于粒子通量的增加,预计SEB的故障率会更高。本文提出了基于SEB截面和粒子通量的高压器件故障率计算方法。该公式可以根据高压器件的外加电压计算空间和地面的故障率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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