Electro-Thermal Simulation Studies for Pulsed Voltage Energy Absorption and Potential Failure in Microstructured ZnO Varistors

R. Joshi, G. Zhao, H. Hjalmarson
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Abstract

Summary form only given. Zinc oxide varistors are ceramic devices made by sintering ZnO powder together with small amounts of other additives such as Bi2O3, MnO2, Co3O4 etc... The presence of Bi-ions trapped at the grain-boundaries are thought to be responsible for a highly nonlinear behavior. The nonlinear current-voltage (I-V) characteristics and excellent energy absorption capabilities, make ZnO varistors very useful as electrical surge arresters. We present a coupled electro-thermal analyses to determine the voltage driven temperature increases and possible impact on material failure in a ZnO varistor. A two-dimensional, random Voronoi network model has been used. The inherently non-linear internal I-V characteristics have been included. A stochastic distribution of grains with varying sizes and barrier breakdown voltages has also been taken into account. The model is time-dependent and includes two-dimensional heat generation and flow. Issues relating to internal heating analyses, time-dependent localized melting, cracking due to thermal stresses, and dynamical evolution towards failure, are addressed. Our results show that application of high voltage pulses can lead to internal ZnO melting. Such phase change is known to permanently damage the non-linear GB chracter associated with the Bi2O3 present in such material. Comparisons between uniform and normally distributed barrier voltages were made. Physically, it was shown that differences would be associated would depend on grain size and the applied bias regime. It has also been shown that reduction in grain size would help lower the maximum internal stress. This is thus a desirable feature, and would also work to enhance the hold-off voltage for a given sample size.
微结构ZnO压敏电阻脉冲电压能量吸收和电位失效的电热模拟研究
只提供摘要形式。氧化锌压敏电阻是由氧化锌粉末与少量其他添加剂(如Bi2O3, MnO2, Co3O4等)烧结而成的陶瓷器件。被困在晶界的双离子的存在被认为是造成高度非线性行为的原因。非线性的电流-电压(I-V)特性和优异的能量吸收能力,使ZnO压敏电阻成为非常有用的电避雷器。我们提出了一个耦合的电热分析来确定电压驱动的温度升高和可能对ZnO压敏电阻材料失效的影响。使用了二维随机Voronoi网络模型。固有的非线性内部I-V特性已包括在内。同时也考虑了不同粒径和势垒击穿电压的随机分布。该模型是时间相关的,包括二维的热生成和流动。讨论了内部加热分析、随时间变化的局部熔化、热应力引起的开裂和走向失效的动态演变等问题。结果表明,高压脉冲可以导致ZnO内部熔化。众所周知,这种相变会永久性地破坏与这种材料中Bi2O3相关的非线性GB特性。对均匀分布势垒电压和正态分布势垒电压进行了比较。物理上,它表明,差异将相关的将取决于晶粒尺寸和应用的偏置制度。减小晶粒尺寸有助于降低最大内应力。因此,这是一个理想的特性,并且还可以提高给定样本量的保持电压。
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