{"title":"Fully automated capacitance measurement system using new precise capacitance box","authors":"Mohammed Helmy Abd El-Raouf, M. H. A. Raouf","doi":"10.1109/CPEM.2016.7540612","DOIUrl":null,"url":null,"abstract":"In this paper, a new accurate capacitance box has been demonstrated to be used for calibration of capacitance measurement devices. 1666 different capacitance values, with minimum number of internal capacitive elements, could be produced by this new capacitance box compared to 1111 steps that are produced by the ordinary corresponding box. The introduced capacitance box has relative accuracy in the range from ±5×10-5 to ±5×10-4. It could be used to perform completely automated capacitance measurements, for the first time, at the National Institute for Standards (NIS), Egypt.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2016.7540612","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In this paper, a new accurate capacitance box has been demonstrated to be used for calibration of capacitance measurement devices. 1666 different capacitance values, with minimum number of internal capacitive elements, could be produced by this new capacitance box compared to 1111 steps that are produced by the ordinary corresponding box. The introduced capacitance box has relative accuracy in the range from ±5×10-5 to ±5×10-4. It could be used to perform completely automated capacitance measurements, for the first time, at the National Institute for Standards (NIS), Egypt.