Direct mapping of the vibration modes of piezoelectric devices using white beam stroboscopic topography at ESRF

Abstract

A new topographic method permits a direct mapping of the amplitude of the vibration modes of piezoelectric devices using white beam stroboscopic topography. With this method it is possible to measure the amplitude of the vibration of a thickness shear mode at each point of an AT cut quartz resonator. The principle of this method is based on the use of stroboscopic section topography obtained with the white beam delivered by a third generation synchrotron source.