How Well Just-In-Time Defect Prediction Techniques Enhance Software Reliability?

Yuli Tian, Ning Li, J. Tian, Wei Zheng
{"title":"How Well Just-In-Time Defect Prediction Techniques Enhance Software Reliability?","authors":"Yuli Tian, Ning Li, J. Tian, Wei Zheng","doi":"10.1109/QRS51102.2020.00038","DOIUrl":null,"url":null,"abstract":"Many Just-In-Time defect prediction (JIT) techniques, which anticipate defect-prone software changes, have been proposed in recent years. Researchers have evaluated these techniques from different perspectives and have drawn inconsistent conclusions about which JIT defect prediction techniques are the most effective and efficient. This paper evaluates JIT techniques from a reliability perspective. For short-term early evaluation, we measure JIT predictive performance on early exposed defects. While for long-term evaluation, we quantify the overall reliability improvement resulted from JIT. A case study applying 11 state-of-the-art JIT methods on 18 large open-source projects has shown: 1) Different JIT methods have their own individual strengths for different purposes, 2) in general, RandomForest is the most effective method in short-term software reliability improvement, and CBS+ performs best in long-term reliability improvement; 3) JIT prediction accuracy is highly correlated to overall reliability improvement.","PeriodicalId":301814,"journal":{"name":"2020 IEEE 20th International Conference on Software Quality, Reliability and Security (QRS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 20th International Conference on Software Quality, Reliability and Security (QRS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/QRS51102.2020.00038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

Many Just-In-Time defect prediction (JIT) techniques, which anticipate defect-prone software changes, have been proposed in recent years. Researchers have evaluated these techniques from different perspectives and have drawn inconsistent conclusions about which JIT defect prediction techniques are the most effective and efficient. This paper evaluates JIT techniques from a reliability perspective. For short-term early evaluation, we measure JIT predictive performance on early exposed defects. While for long-term evaluation, we quantify the overall reliability improvement resulted from JIT. A case study applying 11 state-of-the-art JIT methods on 18 large open-source projects has shown: 1) Different JIT methods have their own individual strengths for different purposes, 2) in general, RandomForest is the most effective method in short-term software reliability improvement, and CBS+ performs best in long-term reliability improvement; 3) JIT prediction accuracy is highly correlated to overall reliability improvement.
实时缺陷预测技术如何提高软件可靠性?
近年来,人们提出了许多即时缺陷预测(JIT)技术,这些技术可以预测容易出现缺陷的软件变更。研究人员已经从不同的角度评估了这些技术,并且得出了关于哪种JIT缺陷预测技术是最有效和最高效的不一致的结论。本文从可靠性角度对JIT技术进行了评价。对于短期的早期评估,我们测量JIT对早期暴露缺陷的预测性能。而对于长期评估,我们量化了JIT带来的整体可靠性改进。通过在18个大型开源项目中应用11种最先进的JIT方法的案例研究表明:1)不同的JIT方法有其各自的优势,用于不同的目的;2)总体而言,随机森林方法在短期内是最有效的软件可靠性改进方法,CBS+方法在长期可靠性改进中效果最好;3) JIT预测精度与整体可靠性提高高度相关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信