Determination of the optical constants of a thin film supported on a thick transparent substrate

S. Azi, F. Okoro
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引用次数: 0

Abstract

The full expression for the minima of transmission and reflection spectra of a thin absorbing film are unwieldy transcendental functions of wavelength. Exact solutions of these equations for optical constants are, therefore, not single valued but can be uniquely determined at the extrema of the spectra instead. The solutions require elaborate computer iteration procedures. For ease of computation, we derived the equation for the transmission minima and reflection maxima With Mathematica™. film constants N and K of a Ge 28 As 12 S 60 thin film were then calculated by solving the non linear equations simultaneously. the solution converged for 1.5 m spectra. Interestingly, published values are in excellent agreement with straightforward calculation using another closed form equation by Swanepoel (1983) with only transmission data. JONAMP Vol. 11 2007: pp. 423-428
透明厚基板上薄膜光学常数的测定
薄吸收膜的透射光谱和反射光谱的最小值的完整表达式是难以处理的波长超越函数。因此,这些光学常数方程的精确解不是单值的,而可以在光谱的极值处唯一地确定。解决方案需要复杂的计算机迭代程序。为了便于计算,我们用Mathematica™推导了透射最小值和反射最大值的方程。同时通过求解非线性方程计算了ge28as12s60薄膜的膜常数N和K。该溶液收敛于1.5 m光谱。有趣的是,已发表的数值与Swanepoel(1983)使用仅传输数据的另一种封闭形式方程进行的直接计算非常吻合。JONAMP Vol. 11 2007: 423-428页
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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