D. Kiesewetter, V. Malyugin, A. Reznik, A. Yudin, N. Zhuravleva
{"title":"Experimental setup for investigation of optically inhomogeneous objects by the spectral-correlation method","authors":"D. Kiesewetter, V. Malyugin, A. Reznik, A. Yudin, N. Zhuravleva","doi":"10.1109/ET.2017.8124354","DOIUrl":null,"url":null,"abstract":"The description of the experimental setup for investigation of optically inhomogeneous surfaces and objects by spectral correlation method is given. The principle of operation of the device, the essence of the spectral-correlation method and the method of processing the received data are discussed. The results of studies of electrical insulating paper during its thermal aging are present as an example of the use of the experimental setup. The possibility of using spectral correlation method to determine the parameters of the inhomogeneities of the materials for electrical and electronic engineering is shown.","PeriodicalId":127983,"journal":{"name":"2017 XXVI International Scientific Conference Electronics (ET)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 XXVI International Scientific Conference Electronics (ET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ET.2017.8124354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The description of the experimental setup for investigation of optically inhomogeneous surfaces and objects by spectral correlation method is given. The principle of operation of the device, the essence of the spectral-correlation method and the method of processing the received data are discussed. The results of studies of electrical insulating paper during its thermal aging are present as an example of the use of the experimental setup. The possibility of using spectral correlation method to determine the parameters of the inhomogeneities of the materials for electrical and electronic engineering is shown.