Empirical analysis of power side-channel leakage of high-level synthesis designed AES circuits

Takumi Mizuno, Hiroki Nishikawa, Xiangbo Kong, Hiroyuki Tomiyama
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引用次数: 0

Abstract

Many internet of things (IoT) devices and integrated circuit (IC) cards have been compromised by side-channel attacks. Power-analysis attacks, which identify the secret key of a cryptographic circuit by analyzing the power traces, are among the most dangerous side-channel attacks. Gen-erally, there is a trade-off between execution time and circuit area. However, the correlation between security and performance has yet to be determined. In this study, we investigate the cor-relation between side-channel attack resistance and performance (execution time and circuit area) of advanced encryption standard (AES) circuits. Eleven AES circuits with different performances are designed by high-level synthesis and logic synthesis. Of the eleven AES circuits, six are circuits with no side-channel attack countermeasures and five are circuits with masking countermeasures. We employ four metrics based on a T-test to evaluate the side-channel attack resistance. The results based on the correlation coefficient show the correlation between side-channel attack resistance and performance. The correlation varies according to four metrics or masking countermeasure. We argue that designers should change their attitudes towards circuit design when considering security.
高级合成AES电路功率侧漏的实证分析
许多物联网(IoT)设备和集成电路(IC)卡都受到了侧信道攻击的影响。功率分析攻击是最危险的边信道攻击之一,它通过分析电源走线来识别密码电路的密钥。通常,在执行时间和电路面积之间存在权衡。然而,安全性和性能之间的相关性还有待确定。在本研究中,我们研究了高级加密标准(AES)电路的侧信道攻击阻力与性能(执行时间和电路面积)之间的关系。采用高级综合和逻辑综合的方法设计了11种不同性能的AES电路。在11个AES电路中,6个是不带侧信道攻击对抗的电路,5个是带掩蔽对抗的电路。我们采用基于t检验的四个指标来评估侧信道攻击阻力。基于相关系数的结果显示了侧信道攻击阻力与性能之间的相关关系。相关性根据四个度量或屏蔽对策而变化。我们认为设计者在考虑安全性时应该改变对电路设计的态度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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CiteScore
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