Reliability and Comparison of Some GEANT4-DNA Processes and Models for Proton Transportation: An Ultra-Thin Layer Study

G. Hoff, R. Thomaz, L. I. Gutierres, Sven Muller, V. Fanti, E. Streck, R. Papaléo
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Abstract

This chapter presents a specific reliability study of some GEANT4-DNA (version 10.02.p01) processes and models for proton transportation considering ultra-thin layers (UTL). The Monte Carlo radiation transport validation is fundamental to guarantee the simulation results accuracy. However, sometimes this is impossible due to the lack of experimental data and, it is then that the reliability evaluation takes an important role. Geant4-DNA runs in an energy range that makes impossible, nowadays, to perform a proper microscopic validation (cross-sections and dynamic diffusion parameters) and allows very limited macroscopic reliability. The chemical damage cross-sections reliability (experiment versus simulation) is a way to verify the consistency of the simulation results which is presented for 2 MeV incident protons beam on PMMA and PVC UTL. A comparison among different Geant4-DNA physics lists for incident protons beams from 2 to 20 MeV, interacting with homogeneous water UTL (2 to 200 nm) was performed. This comparison was evaluated for standard and five other optional physics lists considering radial and depth profiles of deposited energy as well as number of interactions and stopping power of the incident particle.
质子输运的一些GEANT4-DNA过程和模型的可靠性和比较:超薄层研究
本章介绍了考虑超薄层(UTL)的一些GEANT4-DNA (version 10.02.p01)质子输运过程和模型的具体可靠性研究。蒙特卡罗辐射输运验证是保证模拟结果准确性的基础。然而,有时由于缺乏实验数据,这是不可能的,这时可靠性评估就起着重要的作用。Geant4-DNA在一个能量范围内运行,这使得现在不可能进行适当的微观验证(横截面和动态扩散参数),并且允许非常有限的宏观可靠性。化学损伤截面可靠性(实验与模拟)是验证2mev质子束在PMMA和PVC UTL上的模拟结果一致性的一种方法。比较了2 ~ 20 MeV入射质子束与均匀水UTL (2 ~ 200 nm)相互作用时不同的Geant4-DNA物理表。考虑到沉积能量的径向和深度分布,以及入射粒子的相互作用次数和停止能力,对标准和其他五个可选物理列表进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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