{"title":"Large signal load-pull measurements using six-port reflectometers","authors":"F. Deshours, E. Bergeault, L. Jallet, B. Huyart","doi":"10.1109/CPEM.1994.333395","DOIUrl":null,"url":null,"abstract":"This paper describes an active load-pull measurement system, using two six-port junctions for nonlinear characterization of power transistors. Load-pull measurements on a 600 /spl mu/m MESFET have been performed at 2 GHz.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"159 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1994.333395","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This paper describes an active load-pull measurement system, using two six-port junctions for nonlinear characterization of power transistors. Load-pull measurements on a 600 /spl mu/m MESFET have been performed at 2 GHz.<>