{"title":"Comparative Analysis of Enhanced Fault Detection Schemes for Integrated DC Microgrid Protection of Naju","authors":"Jun-Seok Yun, Chul-Won Park","doi":"10.5207/jieie.2022.36.8.039","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":428707,"journal":{"name":"Journal of The Korean Institute of Illuminating and Electrical Installation Engineers","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of The Korean Institute of Illuminating and Electrical Installation Engineers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5207/jieie.2022.36.8.039","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}