A Simple High-Perfomance P-Band First-Order Dual-Port Probe for Spherical Near-Field Antenna Measurements based on the Shorted Annular Patch Antenna

Abstract

This paper presents a new type of P-band first-order dual-port probe for spherical near-field antenna measurements. The probe is based on the well-known shorted annular patch antenna but some extensions are introduced for the probe application. This probe is mechanically simple which facilitates its manufacturing and operation. In addition, it has high performance for impedance bandwidth, pattern, directivity, and gain.