Improving spatial resolution of immunity maps by post-processing

Abstract

Near-field injection is a promising method for the analysis of the susceptibility of electronic boards and circuits. The resulting immunity map provides a precise localization of the sensitive area to electromagnetic disturbances. A major requirement is the spatial resolution of the immunity map. This paper aims at proposing a post-processing method to enhance the spatial resolution of immunity map and validating it on case studies at board and integrated circuit levels.