Proportional Hazard Model of doped low creep lead free solder paste under thermal shock

A. Raj, S. Thirugnanasambandam, T. Sanders, S. Sridhar, Seth Gordon, John L. Evans, F. Megahed, M. Bozack, W. Johnson, Mark Carpenter
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引用次数: 9

Abstract

In this experiment, the thermal performance of various lead-free doped solder paste alloys on leaded and leadless packages on laminate substrates were investigated. The Primary Goal of this test is to find a manufactureable solder paste that will mitigate the effects of aging on lead free solder joints. The results discuss the effects of different paste materials, the effects of doping level, and reflow profile on the resulting reliability of a variety of surface mount components. The test vehicle consists of 35 mm (PBGA 1156), 31mm (SBGA 304), 15 mm (CABGA 208) and 6mm (CABGA 36) ball grid array packages with 1.0 mm, 1.27mm and 0.8mm pitch, respectively. Additionally, a leadless 5mm QFN package (MLF 20) with 0.65mm pitch and 2512 SMRs are included in order to understand the effect of doped solder paste on conventional packages. The test boards are built with (a) three different reflow profiles on 6 mil stencil thickness, and (b) one reflow profile on a 4 mil stencil thickness, to study the differences in doping volume effects of the new doped alloys. The test vehicles were subjected to high temperature accelerated life test (HALT) in liquid shock (thermal shock) testing. Each test vehicle underwent 3000 thermal cycles with peak temperatures of -40°C to +125°C on a 15-minute thermal profile (5 minutes dwell time and 2.5 minutes transition time). Reliability of the test packages were determined from the ability of the components and solder interconnects to withstand the thermal stresses induced by alternating high and low temperature extremes. The time to failure were right censored after 3000 cycles. The experimental variables include paste materials, solder paste manufacturer, Reflow profile, stencil thickness, packages and component solder sphere. The response variable used in this test is Time to Failure (cycles). The effect of experimental variables on Time to Failure were assessed at 5% level of significance using Proportional Hazard Model. It is found that all the experimental variables except reflow profile have significant impact on the Time to Failure. Since this experimental data consists of heavy censoring, Censored Quantile Regression model is developed and it is compared with Proportional Hazard Model.
热冲击下掺杂低蠕变无铅锡膏的比例危害模型
在本实验中,研究了各种无铅掺杂锡膏合金在层压板上有铅和无铅封装上的热性能。该测试的主要目标是找到一种可制造的锡膏,它将减轻老化对无铅焊点的影响。结果讨论了不同膏体材料的影响,掺杂水平的影响,回流分布对各种表面贴装组件的可靠性。测试车辆由35mm (PBGA 1156)、31mm (SBGA 304)、15mm (CABGA 208)和6mm (CABGA 36)球栅阵列封装组成,间距分别为1.0 mm、1.27mm和0.8mm。此外,为了了解掺杂锡膏对传统封装的影响,还包括了0.65mm间距和2512个smr的无引线5mm QFN封装(MLF 20)。采用3种不同的回流焊线和1种不同的回流焊线分别在6mil和4mil两种厚度的模板板上进行了实验,研究了新型掺杂合金在掺杂体积效应上的差异。试验车辆在液体冲击(热冲击)试验中进行了高温加速寿命试验(HALT)。每个测试车辆在15分钟的热剖面(5分钟的停留时间和2.5分钟的过渡时间)上进行了3000次热循环,峰值温度为-40°C至+125°C。测试封装的可靠性取决于组件和焊料互连承受高温和低温交替极端温度引起的热应力的能力。在3000次循环后,故障时间被正确地审查。实验变量包括膏体材料、锡膏生产厂家、回流曲线、模板厚度、封装和组件焊锡球。在这个测试中使用的响应变量是失效时间(周期)。实验变量对失效时间的影响采用比例风险模型在5%显著水平上进行评估。结果表明,除回流剖面外,其他实验变量对失效时间均有显著影响。由于该实验数据存在较大的删减,建立了删减分位数回归模型,并与比例风险模型进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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