Electrostatic capacitances of high-speed SiGe HBT

N. Zerounian, E.R. Garcia, F. Aniel, B. Barbalat, P. Chevalier, A. Chantre
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引用次数: 2

Abstract

The extrinsic electrostatic capacitances of high-speed SiGe HBTs are evaluated both with measurement and modeling. Shrinking dimensions of the core of the HBT increases the influence of the extrinsic capacitance in the performances. The extrinsic capacitances are of half values compare to the intrinsic ones, limiting the cut-off frequencies fT and fMAY by 10-12%, but care must be taken to avoid higher limitations associated with large electrostatic coupling in next device generation.
高速SiGe HBT的静电电容
通过测量和建模对高速SiGe HBTs的外在静电电容进行了评估。磁芯尺寸的缩小增加了外部电容对性能的影响。与固有电容相比,外在电容只有一半的值,将截止频率fT和fMAY限制在10-12%,但必须注意避免下一代器件中与大静电耦合相关的更高限制。
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