New qualification approaches for opto-electronic devices

Abstract

Qualification of opto-electronic devices is a mandatory but complex activity to perform in a fast changing technical environment and under a strong market pressure. In this paper, we analyze the advantages and drawbacks of the traditional qualification approach based on both end-development tests defined by international standards and statistical reliability calculations. We explain how we are adapting our qualification practices towards risk assessment methods and design for reliability process. Looking at the future trends or telecom opto-electronic devices, possible challenges that qualification activity will have to face are finally discussed.