Software-implemented fault injection in operating system kernel mutex data structure

2014 IEEE 5th Latin American Symposium on Circuits and Systems Pub Date : 2014-05-26 DOI:10.1109/LASCAS.2014.6820257

B. Montrucchio, M. Rebaudengo, A. Velasco

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引用次数: 10

Abstract

Embedded and Computer-based systems are subject to transient errors originated from several sources, including the impact of high energy particles on sensitive areas of integrated circuits. The evaluation of the sensitivity of the applications to transient faults is a major issue. The paper presents a new approach for testing the effects of transient faults on the Operating System kernel, specifically focusing on kernel mutex data structure, a key component of the kernel. A Software-implemented Fault Injection tool able to inject faults guaranteeing the non-intrusiveness and repeatability of the fault injection campaign is proposed. An analysis of the results has been performed on a large set of mutexes, in order to evaluate their criticality, in particular during input/output operations. Experimental results, executed on a set of benchmarks programs, show the relevance of the effects of the transient faults on this set of variables. Moreover, a significant percentage of faults can lead to a damage of the system also producing an application failure.

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软件实现的操作系统内核互斥锁数据结构中的故障注入

嵌入式和基于计算机的系统受到来自几个来源的瞬态误差的影响，包括高能粒子对集成电路敏感区域的影响。应用程序对暂态故障的敏感性评估是一个主要问题。本文提出了一种测试暂态故障对操作系统内核影响的新方法，重点研究了内核的关键组成部分——内核互斥锁数据结构。提出了一种软件实现的故障注入工具，能够注入故障，保证故障注入活动的非侵入性和可重复性。对大量互斥体的结果进行了分析，以评估它们的临界性，特别是在输入/输出操作期间。在一组基准程序上执行的实验结果显示了瞬态故障对这组变量的影响的相关性。此外，很大比例的故障会导致系统损坏，也会产生应用程序故障。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2014 IEEE 5th Latin American Symposium on Circuits and Systems

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