Return loss characterization and analysis of high-speed serial interface

W. Beyene, C. Madden, N. Vaidya
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引用次数: 5

Abstract

This paper described the return loss characterization and analysis of a high-speed serial interface with T-coils at the transmitter and receiver. Today's high-speed links utilize equalization to mitigate channel loss and dispersion. In addition, T-coil networks are used at inputs and outputs to improve impedance matching and to enhance the receiver and transmitter bandwidth. To guarantee the transceiver performance, a wide range of Serializer Deserializer (SerDes) compliance specifications exist for the return loss measured at or near the package interface and the Printed Circuit Board (PCB). For multi-protocol SerDes, thus, T-coil networks are often necessary to meet the most stringent return loss specification. This paper presents the analysis and characterization of a high-speed transceiver with T-coils designed in a 28 nm CMOS process. Measurements are also presented to demonstrate the improvement in return loss and bandwidth of the transceiver.
高速串行接口回波损耗特性与分析
本文描述了一种高速串行接口的回波损耗特性和分析,该接口在发送端和接收端均采用t型线圈。今天的高速链路利用均衡来减轻信道损耗和色散。此外,t线圈网络用于输入和输出,以改善阻抗匹配和提高接收和发送带宽。为了保证收发器的性能,对于封装接口和印刷电路板(PCB)附近或附近测量的回波损耗,存在广泛的序列化反序列化(SerDes)合规性规范。因此,对于多协议SerDes, t线圈网络通常需要满足最严格的回波损耗规范。本文介绍了一种采用28纳米CMOS工艺设计的t线圈高速收发器的分析和特性。测量结果也证明了收发器在回波损耗和带宽方面的改进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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