Applying a conventional VNA to nonlinear measurements without using frequency converting standards

Abstract

A novel approach is presented for a measurement system which is able to investigate the most relevant specifications of microwave circuits and components. This unique test stand is configured for on wafer measurements up to 60 GHz, but can also be used for connectorized device measurements. The main measurement capabilities of the system are: Two and three port scattering parameters, noise figure and noise parameters of two port devices, power and gain measurements including harmonic power and harmonic impedances, all mixer parameters including conversion noise and the complete conversion matrix, active load pulling and the spectrum and phase noise of oscillators. Furthermore, a new calibration method has been developed which allows the measurement of absolute values of up to three port power waves at the device under test without frequency converting standards in the calibration The system operates in combination with an automatic wafer probe station. In the future the control software for the prober will be integrated in the measurement system software giving the capability of performing wafer mapping of MMIC's e.g.