{"title":"Composite System Adequacy Assessment Using Monte Carlo Simulation and Logistic Regression Classifier","authors":"Sangit Poudel, Nava Raj Karki","doi":"10.1109/ODICON50556.2021.9429000","DOIUrl":null,"url":null,"abstract":"This paper presents a new method that combines Logistic Regression Classifier (LRC) and Monte Carlo Simulation (MCS) to evaluate the adequacy of a composite power system. LRC is used to pre-classify the system states as failure or success based on training data set provided by conventional MCS itself, but with a relaxed error tolerance level. The proposed method is applied to the IEEE Reliability test system (IEEE-RTS-79) to calculate the annualized and annual indices.The results thus obtained are compared with that of conventional MCS. In different cases, the simulation results provide a significant improvement in computational burden and indices calculation time while maintaining resonable accuracy.","PeriodicalId":197132,"journal":{"name":"2021 1st Odisha International Conference on Electrical Power Engineering, Communication and Computing Technology(ODICON)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 1st Odisha International Conference on Electrical Power Engineering, Communication and Computing Technology(ODICON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ODICON50556.2021.9429000","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents a new method that combines Logistic Regression Classifier (LRC) and Monte Carlo Simulation (MCS) to evaluate the adequacy of a composite power system. LRC is used to pre-classify the system states as failure or success based on training data set provided by conventional MCS itself, but with a relaxed error tolerance level. The proposed method is applied to the IEEE Reliability test system (IEEE-RTS-79) to calculate the annualized and annual indices.The results thus obtained are compared with that of conventional MCS. In different cases, the simulation results provide a significant improvement in computational burden and indices calculation time while maintaining resonable accuracy.