A New Paradigm for Fault-Tolerant Computing with Interconnect Crosstalks

Naveen Kumar Macha, Bhavana Tejaswini Repalle, Sandeep Geedipally, Rafael Rios, Mostafizur Rahman
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引用次数: 8

Abstract

The CMOS integrated chips at advanced technology nodes are becoming more vulnerable to various sources of faults like manufacturing imprecisions, variations, aging, etc. Additionally, the intentional fault attacks (e.g., high power microwave, cybersecurity threats, etc.) and environmental effects (i.e., radiation) also pose reliability threats to integrated circuits. Though the traditional hardware redundancy-based techniques like Triple Modular Redundancy (TMR), Quadded Logic (QL) etc. mitigate the risk to some extent, they add huge hardware overhead and are not very effective. Truly polymorphic circuits that are inherently capable of achieving multiple functionalities in a limited footprint could enhance the fault-resilience/recovery of the circuits with limited overhead. We demonstrate a novel crosstalk logic based polymorphic circuit approach to achieve compact and efficient fault resilient circuits. We show a range of polymorphic primitive gates and their usage in an example functional unit. The functional unit is a single arithmetic circuit that is capable of delivering Multiplication/Sorting/Addition output depending on the control inputs. Using such polymorphic computing units in an ALU would imply that a correct path for functional output is possible even when 2/3rd of the ALU is damaged. Moreover, our benchmarking results show that the crosstalk polymorphic logic style achieves 28% and 62% reduction in transistor count compared to existing polymorphic techniques and CMOS based implementation, respectively. In conjunction with fault detection algorithms, the proposed polymorphic circuit concept can be transformative for fault tolerant circuit design directions with minimum overhead.
基于互连串串的容错计算新范式
先进技术节点的CMOS集成芯片越来越容易受到各种故障的影响,如制造精度不高、变化、老化等。此外,故意故障攻击(如高功率微波、网络安全威胁等)和环境影响(如辐射)也对集成电路的可靠性构成威胁。虽然传统的基于硬件冗余的技术,如三重模块冗余(TMR)、四元逻辑(QL)等,在一定程度上减轻了风险,但它们增加了巨大的硬件开销,并且不是很有效。真正的多态电路本质上能够在有限的占用空间内实现多种功能,可以在有限的开销下增强电路的故障弹性/恢复能力。我们展示了一种新的基于串扰逻辑的多态电路方法,以实现紧凑和高效的故障弹性电路。我们展示了一系列多态基元门及其在一个示例功能单元中的使用。功能单元是一个单一的算术电路,能够根据控制输入提供乘法/排序/加法输出。在ALU中使用这种多态计算单元意味着,即使ALU的三分之二被损坏,也可能有正确的功能输出路径。此外,我们的基准测试结果表明,与现有的多态技术和基于CMOS的实现相比,串扰多态逻辑风格分别减少了28%和62%的晶体管数量。结合故障检测算法,所提出的多态电路概念可以以最小的开销改变容错电路的设计方向。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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