{"title":"A 12-bit 200MS/s Pipelined-SAR ADC in 65-nm CMOS with 61.9 dB SNDR","authors":"Haizhu Liu, Maliang Liu, Zhangming Zhu","doi":"10.1109/EDSSC.2019.8754022","DOIUrl":null,"url":null,"abstract":"This paper presents a 12-bit 200MS/s Pipelined-SAR hybrid architecture ADC with a 3.5-bit MDAC for the first stage and a 9-bit SAR ADC for the second stage. In the MDAC, a low-power high DC-gain class-AB residue amplifier is proposed to achieve 80dB DC-gain and 0.8GHz unity-gain-bandwidth (UGB). In the SAR ADC, two techniques are applied to accelerate the comparison speed to meet the requirement of high-speed ADC. Fabricated in a 65nm CMOS process, the ADC occupies an area of 0.21 mm2 and consumes a power of 7.3 mW. The measured Nyquist SFDR and SNDR are 71.2 dB and 61.9 dB at 200 MS/s. The ADC achieves a FoM of 35.6 fJ/conversion-step.","PeriodicalId":183887,"journal":{"name":"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)","volume":"169 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDSSC.2019.8754022","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This paper presents a 12-bit 200MS/s Pipelined-SAR hybrid architecture ADC with a 3.5-bit MDAC for the first stage and a 9-bit SAR ADC for the second stage. In the MDAC, a low-power high DC-gain class-AB residue amplifier is proposed to achieve 80dB DC-gain and 0.8GHz unity-gain-bandwidth (UGB). In the SAR ADC, two techniques are applied to accelerate the comparison speed to meet the requirement of high-speed ADC. Fabricated in a 65nm CMOS process, the ADC occupies an area of 0.21 mm2 and consumes a power of 7.3 mW. The measured Nyquist SFDR and SNDR are 71.2 dB and 61.9 dB at 200 MS/s. The ADC achieves a FoM of 35.6 fJ/conversion-step.