{"title":"Distortion modeling of active-RC lossy integrator by Volterra series method","authors":"Y. Miao, Yuxing Zhang","doi":"10.1109/ICINFA.2011.5949036","DOIUrl":null,"url":null,"abstract":"In this paper, the distortion of an active-RC lossy integrator is modeled by using Volterra series method. The opamp used in the integrator is divided into different nonlinear stages and their nonlinear coefficients are obtained easily by calculating the Volterra kernel of corresponding stage. The rules of cascade connection and feedback in Volterra method are employed to derive the distortion factors. The results obtained in the paper are suitable to investigate the distortion behaviors of the active-RC lossy integrator quickly. The accuracy of this modeling was verified by comparing the theoretical results with transistor level simulation.","PeriodicalId":299418,"journal":{"name":"2011 IEEE International Conference on Information and Automation","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on Information and Automation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICINFA.2011.5949036","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, the distortion of an active-RC lossy integrator is modeled by using Volterra series method. The opamp used in the integrator is divided into different nonlinear stages and their nonlinear coefficients are obtained easily by calculating the Volterra kernel of corresponding stage. The rules of cascade connection and feedback in Volterra method are employed to derive the distortion factors. The results obtained in the paper are suitable to investigate the distortion behaviors of the active-RC lossy integrator quickly. The accuracy of this modeling was verified by comparing the theoretical results with transistor level simulation.