Stray Voltage Capture for Robust and Ultra-Fast Short Circuit Detection in Power Electronics with Half-Bridge Structure: the Limitation and Implementation

Abstract

This paper proposes a robust and ultra-fast short circuit detection method based on the voltage dip on the half-bridge due to the presence of stray inductance. Results show that the short circuit is detected in less than 200ns, which is a promising solution against the Single-Event Burnout failure type occurrence.