Defect structure of high-resistivity CdTe:Cl crystals according to the data of high-resolution x-ray diffractometry

Abstract

The degree of structural perfection of CdTe:Cl single crystals was estimated by methods of high-resolution Xray diffractometry. Two possible systems of dislocations that consists of two sets of complete 60-degree dislocations and Frank partial dislocations were investigated with the use of Krivoglaz kinematic theory and Monte Carlo method. The density of dislocations that provides correspondence between experimental and simulated reciprocal space maps is determined.