Proton SEL test on dsPIC microcontroller to be used in ExoMars 2020 mission

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI:10.1109/RADECS45761.2018.9328676

P. Manzano, M. Álvarez, J. Manzano, M. Rivas, A. Martín-Ortega, N. Andrés

引用次数: 1

Abstract

Proton latch-up test results are presented to complete the TID and heavy ion SEL tests performed previously on Microchip microcontroller to assess its suitability to be used in an instrument on board ExoMars 2020 mission.

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用于ExoMars 2020任务的dsPIC微控制器上的质子SEL测试

为了完成之前在Microchip微控制器上进行的TID和重离子SEL测试，以评估其在ExoMars 2020任务上的仪器中使用的适用性，提出了质子闭锁测试结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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