A unifying formalism to support automated synthesis of SBSTs for embedded caches

Abstract

The paper presents a new unifying formalism introduced to effectively support the automatic generation of assembly test programs to be used as SBST (Software Based Self-Testing) for both data and instruction cache memories. In particular, the new formalism allows the description of the target memory, of the selected March Test algorithm, and the way this has to be customize to adapt it to the selected cache.